Overview
----------------------------------------------------------------------------------------------------Truly All-IN-ONE measuring machine specialized for FA, MT, VG ,2D‘s Core-Pitch detection of position error.
It is highly useful for quality control and production management.
It’s fully manufactured-in-Japan. Without doubt, the quality is you could trust on.
It can be applied to 2D FA (2D Fiber Array), 2D Matrix Fiber Array, Silicon Photonics, PLC (Planar Lightwave Circuit), AWG (Arrayed Waveguide Grating), optical module (transceiver), CPO (Co-packaged optics)and other products.
Key Benefits:
- High efficiency for mass-measurement:1-2.5 sec/ 1 core. (FA, VG, MT,2DFA)
- Ultra precision & outstanding stability:By 10 times measuring, it is guaranteed that the data achieves 3 sigma ≦ 0.1 um, which is highest level over industry.
- Application flexibility:The machine not only capable of measuring of general products in market. But also, for those specials with rare spec.. For example, in FA measuring, PM fiber, 2D fiber, titled surface(42.5)…etc, are measurable. In VG, the tablet, inconsistency pitch are also realizable in measuring. With customization available, no matter you’re at the stage of R&D or Mass-Production, we ensure you this machine could fit all your expectations.
- Automation for minimizing manual operation error:Our customers enjoy the convenience with its automation. At same time, the operator could be less trained to get familiar with it in short term.
- Easy-control for quality & Minimizing the waste of materials:Which is the key point for customer why they choose us. It is indeed help for better QC in mid-production , meanwhile to keep less waste and save costs.
- High market share:As above the benefits described, we holds high maker share worldwide. In China, Taiwan, Japan, United States, most of leader companies using our machines.
Model | YGN-590-Series |
Measurement Target | Fiber Array V-Groove MT, MT fiber assy, MPO |
Laser Heterodyne | X axis pitch error Y axis pitch error |
Microscope | Infinite Optical System 50X magnification for measuring FA 20X magnification for measuring VG 5X magnification for measuring MT |
CCD Camera | 2464 X 2056 pixel |
Stage | X axis 100mm stroke Y axis 4mm stroke (Customized upon request) Focus axis 4mm stroke |
Control PC | Windows 10 |
Resolution | 0.01 micron |
Repeatability | 3 sigma ≦ 0.1 micron |
FA 量測 FA Measurement | |
|
VG 量測 VG Measurement | |
To Board Top
|
MT 量測 MT Measurement | |
1D MT
2D MT |
|
2D FA 量測 2D FA Measurement (Customized solution) | |
|
Customized solution features: *The Y direction stroke is increased to 30mm (or the stroke can be customized according to demand), and maintain high reproducibility. *Pre-process quality control - silicon wafer inspection. |
Specification
Model | YGN-590-Series |
Measurement Target | Fiber Array V-Groove MT, MT fiber assy, MPO |
Laser Heterodyne | X axis pitch error Y axis pitch error |
Microscope | Infinite Optical System 50X magnification for measuring FA 20X magnification for measuring VG 5X magnification for measuring MT |
CCD Camera | 2464 X 2056 pixel |
Stage | X axis 100mm stroke Y axis 4mm stroke (Customized upon request) Focus axis 4mm stroke |
Control PC | Windows 10 |
Resolution | 0.01 micron |
Repeatability | 3 sigma ≦ 0.1 micron |
Applications
FA 量測 FA Measurement | |
|
VG 量測 VG Measurement | |
To Board Top
|
MT 量測 MT Measurement | |
1D MT
2D MT |
|
2D FA 量測 2D FA Measurement (Customized solution) | |
|
Customized solution features: *The Y direction stroke is increased to 30mm (or the stroke can be customized according to demand), and maintain high reproducibility. *Pre-process quality control - silicon wafer inspection. |